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po-hsuan_wei [2020/11/04 12:37] – [Layout Generation Flow] pohsuan | po-hsuan_wei [2020/11/04 12:39] – [Layout Generation Flow] pohsuan | ||
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Figure 1. Explosion of Design Rules [[3]]; | Figure 1. Explosion of Design Rules [[3]]; | ||
- | [[1]] P. Kinget, " | + | [1] P. Kinget, " |
- | [[2]] K. -W. Su, Y. -M. Sheu, C. -K. Lin, S. -J. Yang, W. -J. Liang, X. Xi, C. -S. Chiang, J. -K. Her, Y. -T. Chia, C. H. Diaz, and C. Hu, “A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics, | + | [2] K. -W. Su, Y. -M. Sheu, C. -K. Lin, S. -J. Yang, W. -J. Liang, X. Xi, C. -S. Chiang, J. -K. Her, Y. -T. Chia, C. H. Diaz, and C. Hu, “A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics, |
- | [[3]] http:// | + | [3] http:// |